Electron Microscopy and Microanalysis Facility
Characterization instrument list
- Transmission Electron Microscope: FEI Talos F200s Scanning Transmission Electron Microscope (S/TEM) equipped with SuperX-EDS detector
- FEI Single Tilt Holder
- FEI Double Tilt Holder
- FEI Double Tilt Low-background EDS Holder
- Gatan 626 Cryo Holder
- Gatan High Field-of-view Single-tilt Tomography Holder
- Focus Ion Beam: Thermo Scientific Scios 2 Dual-beam Focus Ion Beam/ Scanning Electron Microscope (DB FIB/SEM) equipped with
- EDAX Hikari EBSD Camera
- EDAX Octane Elect EDS System
- Scanning Electron Microscope: FEI Nano600 NanoSEM
- Nanoindenter: Hysitron TI-900 TriboIndenter
- In-situ SEM Micro-mechanical Testing System: Alemnis Indenter System
FEI Talos F200s S/TEM
Thermo Scientific Scios 2 FIB/SEM
FEI Nova600 NanoSEM
Sample preparation instrument list
- Buehler Isomet low speed saw
- South Bay Technology Model 850 wire saw
- Pace Technologies TERAPRESS TP-7500 Compression Mounting Press
- Struers Tegramin-20 Auto-polisher
- Buehler VibroMet 2 Vibratory Polisher
- Quorum Technologies K575X Turbo Sputter Coater
- Electron Microscopy Sciences 150T Turbo-pumped Combo Sputter and Carbon Coater
- Fischione Instruments Model 150 Dimpling Grinder
- Fischione Instruments Model 170 Ultrasonic Disk Cutter
- Fischione Instruments Model 1010 Low Angle Ion Mill
- Fischione Instruments Model 110 Automatic Twin-jet Electropolisher
- SPI Plasma Prep Cleaner
- Leica Ultramicrotome EM UC7
- Olympus PMG3 Inverted Metallurgic Microscope with Attached Digital Camera