Equipment list: Scanning Electron Microscope (SEM) and Electron Probe Microanalyzer (EPMA) Laboratory
Instrumentation
- FE-EPMA (JEOL JXA-iHP200F)
- FE-SEM (JEOL JSM 7100FT)
- WSEM (JEOL JSM 6010LA)
- Leica EM ACE600 sputter coater
- EMS 150T sputter coater
Analytical capabilities
- High resolution imaging/stitching
- Large area EBSD mapping
- Hyperspectral and panchromatic CL
- Quantitative WDS mapping
- Large area automated particle search
- Combined quantitative EDS-WDS point analyses
- Trace-element thermometry
- MAN background analyses
Technical info & pricing: | Joel DesOrmeau | (775) 784-6054
For entities external to NSHE, contact the Nevada Center for Applied Research: ncar@unr.edu | (775) 784-4781